Time-of-flight secondary ion mass spectroscopy with bismuth primary ions of clean and air-exposed surfaces of tellurium

Malgorzata Trzyna; Nicolas Berchenko; Derk Rading; Jozef Cebulski

doi:10.1255/ejms.1297

Time-of-flight secondary ion mass spectroscopy with bismuth primary ions of clean and air-exposed surfaces of tellurium

Eur J Mass Spectrom (Chichester). 2014;20(6):429-36. doi: 10.1255/ejms.1297.

Authors

Malgorzata Trzyna¹, Nicolas Berchenko², Derk Rading³, Jozef Cebulski⁴

Affiliations

¹ Center for Microelectronics and Nanotechnology, Rzeszow University, Rejtana 16A, Rzeszow 35-959, Poland. malgorzata.trzyna@gmail.com.
² Center for Microelectronics and Nanotechnology, Rzeszow University, Rejtana 16A, Rzeszow 35-959, Poland. nberchen@gmail.com.
³ ION-TOF GmbH, Heisenberg str. 15, Muenster, 48149, Germany. derk.rading@iontof.com.
⁴ Center for Innovation and Transfer of Natural Sciences and Engineering Knowledge, Rzeszow University, Rejtana 16A, Rzeszow 35-959, Poland. cebulski@univ.rzeszow.pl.

PMID: 25905867
DOI: 10.1255/ejms.1297

Abstract

The regularity of Bi(+), Bi(3+) and Bi(3++) primary ions in the time- of-flight secondary ion mass spectroscopy fragment pattern of air oxidized Te and Bi(+) direct-current scan cleaned Te is discussed. The most intensive fragments for a cleaned Te surface are positive and negative Tex and BiTex clusters. The sequence of secondary ion cluster formation is Bi-Te alloying followed by sputtering and ionization. For oxidized Te the chemical composition of the produced TexOy fragments satisfies the relation y=2x for positive fragments and y=2x+1 for negative ones. Experimental findings are in a good agreement with the results predicted by Plog's model for TeO2.