High resolution STEM of quantum dots and quantum wires

Shima Kadkhodazadeh

doi:10.1016/j.micron.2012.10.004

High resolution STEM of quantum dots and quantum wires

Micron. 2013 Jan:44:75-92. doi: 10.1016/j.micron.2012.10.004. Epub 2012 Oct 13.

Author

Shima Kadkhodazadeh¹

Affiliation

¹ Centre for Electron Nanoscopy, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark. shka@cen.dtu.dk

PMID: 23121835
DOI: 10.1016/j.micron.2012.10.004

Abstract

This article reviews the application of high resolution scanning transmission electron microscopy (STEM) to semiconductor quantum dots (QDs) and quantum wires (QWRs). Different imaging and analytical techniques in STEM are introduced and key examples of their application to QDs and QWRs are presented. In addition, the benefits offered by aberration correction are discussed and an outlook for future developments of high resolution STEM analysis of QDs and QWRs is given.

Publication types

Research Support, Non-U.S. Gov't