Multilayer graphene-coated atomic force microscopy tips for molecular junctions

Abstract

Multilayer graphene tips are developed for conducting probe atomic force microscopy for the formation of molecular junctions. Molecular junctions using graphene tips show very small tip-to-tip variance, excellent operational stability, good endurance, and long shelf-life. These properties, together with high yield and the simple processing involved, suggest that commercial mass-production of graphene tips is viable for molecular electronic applications.