Near infrared spectroscopy patents for the physicochemical characterization of nanomaterials: the road from production to routine high-throughput quality control

Recent Pat Nanotechnol. 2012 Jun 1;6(2):135-41. doi: 10.2174/187221012800270171.

Abstract

The measurement of the physical and chemical ("physicochemical") properties of nanomaterials used in industry and science including chemistry, pharmacy, medicine, toxicology, etc., is time-consuming, expensive and requires a lot of experience of a well trained lab staff. Near-infrared spectroscopy (NIR; 4.000-12.000 cm(-1)), working in the wavelength region with the highest IR energy, allows obtaining multifactorial information of the material under investigation due to the occurrence of a high number of combination and overtone vibrations. Coupling of an optimized and well-designed measurement technique with multivariate data analysis (MVA) leads to a non-destructive, fast, reliable and robust novel NIR technique for the fast and non-invasive physicochemical characterization, which is suitable for high-throughput quality control due to the short analyses times of only a few seconds. In the following chapters, the patented basic NIR techniques full-filling these aims are introduced, described, summarized and critically discussed.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Fullerenes / chemistry
  • Nanostructures / chemistry*
  • Nanostructures / standards
  • Nanotubes, Carbon / chemistry
  • Patents as Topic*
  • Pharmaceutical Preparations / chemistry
  • Principal Component Analysis
  • Quality Control
  • Silicates / chemistry
  • Spectroscopy, Near-Infrared* / standards

Substances

  • Fullerenes
  • Nanotubes, Carbon
  • Pharmaceutical Preparations
  • Silicates
  • fullerene C60