Thickness measurement of organic films using Compton scattering of characteristic X-rays

Jong-Yun Kim; Yong Suk Choi; Yong Joon Park; Kyuseok Song; Sung-Hee Jung; Esam M A Hussein

doi:10.1016/j.apradiso.2011.03.048

Thickness measurement of organic films using Compton scattering of characteristic X-rays

Appl Radiat Isot. 2011 Sep;69(9):1241-5. doi: 10.1016/j.apradiso.2011.03.048. Epub 2011 Apr 9.

Authors

Jong-Yun Kim¹, Yong Suk Choi, Yong Joon Park, Kyuseok Song, Sung-Hee Jung, Esam M A Hussein

Affiliation

¹ Nuclear Chemistry Research Division, Korea Atomic Energy Research Institute, Daedeok-daero, Dukjin-dong Yuseong-gu, Daejeon, Republic of Korea. kjy@kaeri.re.kr

PMID: 21514169
DOI: 10.1016/j.apradiso.2011.03.048

Abstract

An X-ray scattering method is presented for determining the thickness of an organic film placed on a steel substrate. The strong peaks of characteristic X-rays are taken as an advantage to measure the intensity of backscattered photons. It is shown that the intensity of Compton scattering of characteristic X-rays is proportional to film thickness, up to the thickness of 250 μm of acrylic adhesive layers. In addition, the measurement time was 300 ms, providing a simple and convenient method for on-line for thickness monitoring.

Publication types

Research Support, Non-U.S. Gov't