Atomic scale Kelvin probe force microscopy studies of the surface potential variations on the TiO2(110) surface

Phys Rev Lett. 2008 Jun 13;100(23):236104. doi: 10.1103/PhysRevLett.100.236104. Epub 2008 Jun 13.

Abstract

From an interplay of simultaneous Kelvin probe force microscopy and noncontact atomic force microscopy we study atomic-scale variations in the electronic surface potential on TiO(2)(110). Both imaging channels reveal an atomic contrast reflected by the geometry and charged state of the alternating rows of Ti and O surface atoms. From a thorough cross-section analysis we add significant trust to the concept of a local contact potential difference, and determine from this the chemical identity of individual surface species and their role in setting up the local surface potential.