Magnetic double resonance in force microscopy

Phys Rev Lett. 2006 Apr 7;96(13):137604. doi: 10.1103/PhysRevLett.96.137604. Epub 2006 Apr 7.

Abstract

Magnetic-resonance force microscopy is combined with cross-polarization and spin-decoupling NMR techniques to obtain double-resonance NMR signals of micrometer-scaled objects. The effective one-dimensional spatial resolution obtained in our experiments performed on a KPF6 single crystal sample is approximately 0.5 microm. The spectral linewidth of 900 Hz is sample limited. The described double-resonance techniques can introduce new chemical specificity to the magnetic-force sensor.