Measurement of the adhesion force between carbon nanotubes and a silicon dioxide substrate

Nano Lett. 2006 May;6(5):953-7. doi: 10.1021/nl060018t.

Abstract

Carbon nanotube adhesion force measurements were performed on single-walled nanotubes grown over lithographically defined trenches. An applied vertical force from an atomic force microscope (AFM), in force distance mode, caused the tubes to slip across the 250-nm-wide silicon dioxide trench tops at an axial tension of 8 nN. The nanotubes slipped at an axial tension of 10 nN after being selectively coated with a silicon dioxide layer.

Publication types

  • Research Support, U.S. Gov't, Non-P.H.S.

MeSH terms

  • Microscopy, Atomic Force
  • Nanotubes, Carbon / chemistry*
  • Silicon Dioxide / chemistry*
  • Static Electricity

Substances

  • Nanotubes, Carbon
  • Silicon Dioxide