Edge-jump inversion in the Si L3,2-edge optical XAFS of porous silicon
J Synchrotron Radiat
.
1999 May 1;6(Pt 3):215-6.
doi: 10.1107/S0909049599001314.
Epub 1999 May 1.
Authors
T K Sham
1
,
I Coulthard
Affiliation
1
Department of Chemistry, University of Western Ontario, London, Canada. sham@uwo.ca
PMID:
15263253
DOI:
10.1107/S0909049599001314
No abstract available