Charge collection and radiation hardness of a SOI microdosimeter for medical and space applications

IEEE Trans Nucl Sci. 1998 Dec;45(6):2700-10. doi: 10.1109/23.736518.

Abstract

The first results obtained using a SOI device for microdosimetry applications are presented. Microbeam and broadbeam spectroscopy methods are used for determining minority carrier lifetime and radiation damage constants. A spectroscopy model is presented which includes the majority of effects that impact spectral resolution. Charge collection statistics were found to substantially affect spectral resolution. Lateral diffusion effects significantly complicate charge collection.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Alpha Particles*
  • Biophysical Phenomena
  • Biophysics
  • Boron Neutron Capture Therapy
  • Computer Simulation*
  • Linear Energy Transfer
  • Models, Theoretical*
  • Neutrons
  • Particle Accelerators
  • Phantoms, Imaging
  • Protons
  • Radiometry / instrumentation*
  • Silicon*
  • Spectrum Analysis
  • Technology, Radiologic

Substances

  • Protons
  • Silicon