New experimental technique for determining real-space atomic images applied to aluminum adsorbed on silicon (111)
Phys Rev Lett
.
1993 Jul 12;71(2):251-254.
doi: 10.1103/PhysRevLett.71.251.
Authors
H Wu
,
GJ Lapeyre
,
H Huang
,
SY Tong
PMID:
10054902
DOI:
10.1103/PhysRevLett.71.251
No abstract available