Characterization of bias-enhanced nucleation of diamond on silicon by invacuo surface analysis and transmission electron microscopy
Phys Rev B Condens Matter
.
1992 May 15;45(19):11067-11084.
doi: 10.1103/physrevb.45.11067.
Authors
BR Stoner
,
G Ma
,
SD Wolter
,
JT Glass
PMID:
10001029
DOI:
10.1103/physrevb.45.11067
No abstract available